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Edge Profiler

Non-contact automatic measurement of the shape and size of both edge and notch wafers after wafer grinding

Edge Profiler

Feature

  • Detection method: Non-contact and non-destructive.
  • Measurement results can be saved and printed.
  • Measurement results are output instantaneously.
  • Can read the detected images for repeated measurements.

Specification

Item Description
Wafer Size ~300 mm
Wafer Thickness Range 500 ~ 1400 μm (Adjustable by changing lenses)
Dimensional accuracy 1 μm
Angle accuracy 0.1°
Dimensional correction accuracy 1 μm
Angle correction accuracy 0.1°

※For detailed specifications, please contact us

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