PRODUCT & SERVICE
This system inspects the surface condition of mirrored surface samples with high sensitivity.
The detection results are expressed in brightness (white) and dark (black) on the monitor.

| Item | Description |
|---|---|
| Wafer Size | Maximum 12 inches |
| Inspection content | Flatness, dimple, mound, saw mark, orange peel etc. |
| Detection sensitivity | Continuous detection sensitivity variable |
| Inspection magnification | 1-3 times mode switching (Standard feature) |
| Camera | high resolution CCD camera |
※For detailed specifications, please contact us
关于产品的咨询及相关事宜,请随时与我们联系。